Please use this identifier to cite or link to this item: https://publication.npru.ac.th/jspui/handle/123456789/1305
Title: The Study of Buildup Factor in the Silicate Glass System Doped with Bismuth Oxide, Barium Oxide and Lead Oxide in Energy Range from 0.015 to 15 MeV using the Phy-X Program
Other Titles: การศึกษาค่า Buildup factor ของรังสีแกมมาในระบบแก้วซิลิเกตที่เจือด้วยบิสมัทออกไซด์ แบเรียมออกไซด์และตะกั่วออกไซด์ ระหว่างช่วงพลังงาน 0.015 ถึง 15 เมกะอิเล็กตรอนโวลต์ โดยใช้โปรแกรม Phy-X
Authors: Yonphan, Supakit
Kaewkhao, Jakrapong
Limkitjaroenporn, Pruittipol
Keywords: radiation parameters
silicate glass
mass attenuation coefficients
the Phy-X Program
Issue Date: 8-Jul-2021
Publisher: The 13th NPRU National Academic Conference Nakhon Pathom Rajabhat University
Abstract: In this research, the mass attenuation coefficients and buildup factor had been investigated in the silicate glass system doped with bismuth oxide barium oxide and lead oxide in compositions of 20RmOn: 80SiO2 (where RmOn are Bi2O3, BaO, and PbO) were computed by the Phy-X program in the energy range 0.015 to 15 MeV. From calculated results, the mass attenuation coefficients value of glasses doped with bismuth oxide was higher than barium oxide and lead oxide. The buildup factor of all glasses shows the low value of EBF and EABF at the energy range 0.15 to 1 MeV and beyond 2 MeV, was found that the photoelectric effect and pair production is a major interaction. While, the EBF and EABF values were higher at energy range 0.1 to 2 MeV, due to the Compton scattering effect is a major interaction. As a result of comparing the interaction of the three types of glass, it was found that the glass with the most interaction was bismuth oxide-doped silicate glass. Followed by the lead oxide, and the lowest is barium oxide.
URI: https://publication.npru.ac.th/jspui/handle/123456789/1305
Appears in Collections:Proceedings of the 13th NPRU National Academic Conference

Files in This Item:
File Description SizeFormat 
npru_050.pdf252.85 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.