Seebeck coefficient and electrical resistivity of CuEuO2 n-type semiconductor

Abstract

In this work, Eu2O3 was replaced Al2O3 in CuAlO2 structures. The CuEuO2 was prepared by conventional solid-state reaction method. The Seebeck coefficient and electrical resistivity were measured by ZEM-3 series in low pressure helium gas atmosphere at temperature ranges of 325􀀐520 K. It was found that, both electrical resistivity decreases with increasing of temperature while Seebeck coefficient and power factor show the opposite trend. The power factor was calculated by P = S2 / P (where S is Seebeck coefficient and P is electrical resistivity) and exhibit highest value about 28 uWm-1K-2 at 520 K.